Read device and fabrication details

#Open the paper behind a performance record

Open the Device Database, follow the search guide to find a record, then select its paper title. Check its title, DOI, device direction and device ID before reading the core metrics and layer sequence.

Return to the list to inspect other records under the current search and category. Keep device IDs when comparing designs so that different devices from one paper remain distinguishable.

#Follow fabrication steps through the stack

The fabrication section connects numbered steps with material cards. Select a step to read its material and deposition or treatment method, then compare it with the layer structure below.

A layer may include composition, additives and interface-treatment information. Retain its position, role and fabrication order when recording a recipe.

#Explore the 3D layer view

Select a layer in the 3D stack, then inspect its material, layer type, thickness, composition and notes in the detail panel.

Chinese interface. Details correspond to the selected layer. Consult the paper for missing thicknesses or recipes.

#Check stability and control data

Read test duration and performance retention together with temperature, humidity, illumination and encapsulation. Results under different conditions are not interchangeable.

When the page compares a best device with a control, confirm their sample identities and test conditions before interpreting the difference. Check extracted values, units and associations against the paper.

#Trace the source and discuss a design

Follow the DOI to verify recipes, metrics and test methods. Collect missing parameters as open questions rather than filling them with values from another paper.

Take paper references, device structures and constraints into Materials Synthesis Design to discuss a PSC design. Use the device hypergraph to explore relationships among materials, processes and solvents.

For a complete exercise, see Prepare a PSC design from a device paper.