Find device performance records

#Find devices reported in papers

Open Resources → Device Database. Choose solar cells, light-emitting devices, transistors or photodetectors, enter a paper or device search term, and select Search.

The database displays structured device records extracted from papers. This page supports searching and reading; it has no controls for manually creating or editing device records. Keep paper and device identifiers when checking values and fabrication conditions.

Metrics vary by category. Solar cells use PCE, Voc, Jsc and FF; light-emitting devices use EQE, luminance and luminous efficiency. Expand the performance filters to narrow the range.

#Combine keywords and performance filters

Search by device, material system, structure route or DOI. Use a DOI for a known paper or a material name to explore a design route.

Expand performance filters, enter ranges using the displayed units and apply. Select sortable metric headers to change sort direction. Keep paper and device identifiers, and check comparable test conditions first.

You can enter only a lower or upper bound. When both are present, the lower bound must not exceed the upper bound. Multiple performance ranges apply together. Use pagination to browse further and reset to clear keywords and performance ranges.

#Distinguish statistics, pages and graph counts

A paper can contain several devices, layers and process records, so these counts need not match. Changing pages changes the displayed records; the current page size does not represent all matching results. Set the paper scope separately in the hypergraph view.

#Export the current page

1. Apply the search and filters, then wait for the current page to load.
2. Check the page number and page size, then select Export view.
3. Save devices.json. Separately record the category, keywords, performance ranges, page number and query date.

The file contains JSON data for records loaded on the current page, excluding other pages. It is not a table screenshot or an Excel file. Export is unavailable when the page has no records. To retain several pages, export each page and use distinct filenames.

Query conditions are not attached as a separate description in the file. When reusing the data, check the paper sources and device identifiers as well.

#Common metrics

• PCE (%): maximum electrical output power divided by incident light power.
• Voc (V): open-circuit voltage, measured at zero current.
• Jsc (mA/cm²): short-circuit current density, measured at zero voltage.
• FF (%): fill factor, the ratio of maximum output power to Voc × short-circuit current.

Read values and units in the device details, then follow the DOI to check illumination, area and scan versus steady-state measurements. See the photovoltaic efficiency data guide.

#Check conditions before comparing performance

The results table includes papers, device identifiers, performance, layer sequences, journals and years. Open a paper title for device details, or follow its DOI to the original source.

Before comparing efficiency, check illumination, device area, measurement method and stability conditions. Indoor low-light PCE does not directly describe performance under standard sunlight.

A dash means that a value was not supplied. Check automatically identified best-performing devices and controls against the paper, including whether they were tested under the same conditions.

#Read a device detail page

Details bring together performance, fabrication steps and layer structure.

1. Check the core metrics, paper information and device ID.
2. Read each fabrication step for materials, methods and parameters.
3. Inspect the 3D layer structure and select a layer for its details. Use the exploded view to separate the layers visually.
4. Read stability data alongside duration, temperature, humidity, atmosphere, illumination and encapsulation.

The 3D view explains layer relationships. Return to the paper for missing thicknesses or recipe details.

Chinese interface. After selecting a layer in the 3D view, check its number, material, thickness and notes in the detail panel.

#Explore relationships in the hypergraph

Switch to the hypergraph view to explore connections among materials, devices and papers. Adjust the device direction or paper count, then inspect nodes, relationships and evidence.

The full hypergraph is currently available. Other views marked as coming soon are not yet usable. Use graph connections to find evidence, and consult the paper and experiments when assessing causation.

To discuss a PSC design using a paper's layer structure, continue to Materials synthesis.

See Device and fabrication details and Device hypergraphs for detailed steps.

For a complete search-to-design exercise, see Prepare a PSC design from a device paper.